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* [[Medium energy ion scattering]] (MEIS) and [[Rutherford backscattering spectroscopy|Rutherford backscattering]] (RBS) spectroscopies involve a similar setup to LEIS but use ions in the energy range of ~100 keV (MEIS) and ~1-2 MeV (RBS) to probe surfaces. Surface sensitivity is lost as a result of the use of higher energy particles, so while MEIS and RBS can still provide information about a sample they are incapable of providing true first-layer sensitivity.
* [[Secondary ion mass spectrometry]] (SIMS) involves the detection of ionic species ejected from a surface as a result of energetic particle impact. While SIMS is capable of giving depth profiles of the elemental and molecular composition of a sample, it is an inherently destructive method and is generally does not give [[crystal structure|structural]] information.
* [[X-ray photoelectron spectroscopy]] (XPS) is capable of surface elemental analysis, but samples a much more broad region of a sample than LEIS and so is not able to distinguish the first layer from subsurface layers. Since XPS relies on ejection of [[core electron|core-level electrons]] from atoms it is unable to detect [[hydrogen]] or [[helium]] atoms in a sample.
* [[Low-energy electron diffraction]] (LEED) is often used in combination with LEIS in order to facilitate proper sample alignment. LEED can give detailed structural information about a sample including surface [[superstructure]]s and alignment of [[adsorbate]]s. LEED is not element-specific and so cannot be used to determine surface elemental composition.
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* [[Surface engineering]]
* [[Surface science]]
{{Authority control}}
[[Category:Scientific techniques]]
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